DI332N04PQ-AQ
MOSFETs (Field Effect Transistors)

Product information

Product family	MOSFETs (Field Effect Transistors) (Power) switches, signal processing, polarity protection
Article description	DI332N04PQ-AQ MOSFET, PowerQFN 5x6, N, 40V, 332A, 0.85mΩ, 175°C AEC-Q101
Minimum order quantity	5.000
Stock	0
Customs Tariff Number	85412900
RoHS	compliant with exemption 7(a)-I
REACH	declarable
Lead free	No
Halogen free	No

Article number	DI332N04PQ-AQ

Type	SMD
Package	PowerQFN 5x6
Qualification	AEC-Q101
Config	Single
Life Cycle	engineering sample
ESD sensitive	No
MSL	3

ESD protection	ESD protected	No
Polarity	pol	N
Drain source voltage	VDS	40 V

Drain current 25°C	ID	332.000 A
On-resistance 1	RDSon1	0.00085 Ω
	@ ID	20.000 A
	@ VGS	10 V
Drain current 100°C	ID	235.000 A
On-resistance 2	RDSon2	0.00000 Ω
	@ ID	0.000 A
	@ VGS	0 V
Junction temperature	Tjmin	-55 °C
	Tjmax	175 °C
Power dissipation	Ptot	159.000 W
	@ TLoc	25 °C
	Location	Contact
Avalanche	No
Peak drain current	IDM	1328.000 A
	@ tp	100 µs
Threshold voltage	VGSth min	2.0 V
	VGSth max	4.0 V
Turn-on delay time	tD(on)	34 ns
Rise time	tr	46 ns
Turn-off delay time	tD(off)	25 ns
Fall time	tf	18 ns
Total gate charge (10V)	Qg (10V)	81.0 nC
Total gate charge (4.5V)	Qg (4.5V)	0.0 nC
Gate-drain charge	Qgd	18 nC
Single pulse avalanche energy	Eas	470.0 mJ
Input capacitance	Ciss	5501 pF
Output capacitance	Coss	3144 pF
Reverse transfer capacitance	Crss	132 pF
Reverse recovery charge	Qrr	56.0 nC
Case flammability	UL94-V0	Yes
Net weight	mnet	0.1 g
Marking	Marking	Type
Thermal resistance junction	RTH	0.9 K/W
	Location	case
UL recognized	UL-Recognition	null
Thermal resistance junction (b)	RTH	40.0 K/W
	Location	ambient
Storage temperature	Tsmin	-55 °C
	Tsmax	175 °C
Solder & Assembly	Solder & Assembly	260°/10s
Gate source leakage current	IGSS	0.1 µA
	@ VGS	20 V
Drain source leakage current	IDSS	1 µA
	@ VDS	80 V
Gate source voltage DC	VGSS	20 V
Gate source voltage ESD	VGSS	null V
Forward transconductance	gfs	9.9 mA/V
Intrinsic gate resistance	RGi	1 Ω