DI117N04PQ-AQ
MOSFETs (Field Effect Transistors)

Product information

Product family MOSFETs (Field Effect Transistors)
(Power) switches, signal processing, polarity protection
Article description DI117N04PQ-AQ
MOSFET, PowerQFN 5x6, N, 40V, 117A, 3.3 mΩ, AEC-Q101
Minimum order quantity 5.000
Stock 0
Customs Tariff Number 85412900
RoHS compliant with exemption 7(a)-I
REACH declarable
Lead free No
Halogen free No

Distributor Availability

Technical data

Article number DI117N04PQ-AQ
DI117N04PQ-AQ Single
Type SMD
Package PowerQFN 5x6
Qualification AEC-Q101
Config Single
Life Cycle engineering sample
ESD sensitive No
MSL 3
 
ESD protection ESD protected No
Polarity pol N
Drain source voltage VDS 40 V
Drain current 25°C ID 117.000 A
On-resistance 1 RDSon1 0.00330
@ ID 20.000 A
@ VGS 10 V
Drain current 100°C ID 83.000 A
On-resistance 2 RDSon2 0.00000
@ ID 0.000 A
@ VGS 0 V
Junction temperature Tjmin -55 °C
Tjmax 175 °C
Power dissipation Ptot 75.000 W
@ TLoc 25 °C
Location Junction
Avalanche No
Peak drain current IDM 387.000 A
@ tp
Threshold voltage VGSth min 2.0 V
VGSth max 4.0 V
Turn-on delay time tD(on) 4 ns
Rise time tr 4 ns
Turn-off delay time tD(off) 18 ns
Fall time tf 9 ns
Total gate charge (10V) Qg (10V) 18.0 nC
Total gate charge (4.5V) Qg (4.5V) 0.0 nC
Gate-drain charge Qgd 2.5 nC
Single pulse avalanche energy Eas 65.0 mJ
Input capacitance Ciss 1532 pF
Output capacitance Coss 855 pF
Reverse transfer capacitance Crss 50 pF
Reverse recovery charge Qrr 19.0 nC
Case flammability UL94-V0 No
Net weight mnet
Marking Marking
Thermal resistance junction RTH
Location
UL recognized UL-Recognition
Thermal resistance junction (b) RTH
Location
Storage temperature Tsmin
Tsmax
Solder & Assembly Solder & Assembly
Gate source leakage current IGSS
@ VGS
Drain source leakage current IDSS
@ VDS
Gate source voltage DC VGSS
Gate source voltage ESD VGSS
Forward transconductance gfs
Intrinsic gate resistance RGi

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