DI070N04PQ-AQ
MOSFETs (Field Effect Transistors)

Product information

Product family MOSFETs (Field Effect Transistors)
(Power) switches, signal processing, polarity protection
Article description DI070N04PQ-AQ
MOSFET, PowerQFN 5x6, N, 40V, 70A, 5.2mΩ, 150°C, AEC-Q101
Minimum order quantity 5.000
Stock 0
Customs Tariff Number 85412900
RoHS compliant with exemption 7(a)-I
REACH declarable
Lead free No
Halogen free No

Technical data

Article number DI070N04PQ-AQ
DI070N04PQ-AQ Single
Type SMD
Package PowerQFN 5x6
Qualification AEC-Q101
Config Single
Life Cycle engineering sample
ESD sensitive No
MSL 3
 
ESD protection ESD protected No
Polarity pol N
Drain source voltage VDS 40 V
Drain current 25°C ID 70 A
On-resistance 1 RDSon1 0.0052
@ ID 20 A
@ VGS 10 V
Drain current 100°C ID 49 A
On-resistance 2 RDSon2 0.0065
@ ID 10 A
@ VGS 4.5 V
Junction temperature Tjmin -55 °C
Tjmax 175 °C
Power dissipation Ptot 39 W
@ TLoc 25 °C
Location Contact
Avalanche Yes
Peak drain current IDM 210 A
@ tp 1000 µs
Threshold voltage VGSth min 1.3 V
VGSth max 2.3 V
Turn-on delay time tD(on) 11 ns
Rise time tr 42 ns
Turn-off delay time tD(off) 11 ns
Fall time tf 7 ns
Total gate charge (10V) Qg (10V) 21 nC
Total gate charge (4.5V) Qg (4.5V) 10 nC
Gate-drain charge Qgd 4 nC
Single pulse avalanche energy Eas 39 mJ
Input capacitance Ciss 1102 pF
Output capacitance Coss 356 pF
Reverse transfer capacitance Crss 20 pF
Reverse recovery charge Qrr 17 nC
Case flammability UL94-V0 Yes
Net weight mnet 0.1 g
Marking Marking Type
Thermal resistance junction RTH 3.8 K/W
Location case
UL recognized UL-Recognition null
Thermal resistance junction (b) RTH 50 K/W
Location ambient
Storage temperature Tsmin -55 °C
Tsmax 175 °C
Solder & Assembly Solder & Assembly 260°/10s
Gate source leakage current IGSS 0.1 µA
@ VGS 20 V
Drain source leakage current IDSS 1 µA
@ VDS 40 V
Gate source voltage DC VGSS 20 V
Gate source voltage ESD VGSS null V
Forward transconductance gfs 20 mA/V
Intrinsic gate resistance RGi 1.1

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