DI064P04D1-Q
MOSFETs (Field Effect Transistors)

Product information

Product family MOSFETs (Field Effect Transistors)
(Power) switches, signal processing, polarity protection
Article description DI064P04D1-Q
MOSFET, DPAK, P, -40V, -64A, 7.6mΩ, 150°C
Minimum order quantity 2.500
Stock 0
Customs Tariff Number 85412900
RoHS compliant with exemption 7(a)-I
REACH declarable
Lead free No
Halogen free No

Technical data

Article number DI064P04D1-Q
DI064P04D1-Q Single
Type SMD
Package TO-252AA/D-PAK
Qualification AEC-Q compliant
Config Single
Life Cycle engineering sample
ESD sensitive No
MSL 3
 
ESD protection ESD protected No
Polarity pol P
Drain source voltage VDS -40 V
Drain current 25°C ID -64 A
On-resistance 1 RDSon1 0.0076
@ ID -30 A
@ VGS -10 V
Drain current 100°C ID -40 A
On-resistance 2 RDSon2 null
@ ID null A
@ VGS null V
Junction temperature Tjmin -55 °C
Tjmax 150 °C
Power dissipation Ptot 48.3 W
@ TLoc 25 °C
Location Contact
Avalanche Yes
Peak drain current IDM -350 A
@ tp 10000 µs
Threshold voltage VGSth min -2 V
VGSth max -4 V
Turn-on delay time tD(on) 44 ns
Rise time tr 52 ns
Turn-off delay time tD(off) 30 ns
Fall time tf 10 ns
Total gate charge (10V) Qg (10V) 105 nC
Total gate charge (4.5V) Qg (4.5V) null nC
Gate-drain charge Qgd 17 nC
Single pulse avalanche energy Eas 221 mJ
Input capacitance Ciss 7475 pF
Output capacitance Coss 555 pF
Reverse transfer capacitance Crss 3299 pF
Reverse recovery charge Qrr 27 nC
Case flammability UL94-V0 Yes
Net weight mnet 0.32 g
Marking Marking Type
Thermal resistance junction RTH 2.6 K/W
Location case
UL recognized UL-Recognition null
Thermal resistance junction (b) RTH 38 K/W
Location ambient
Storage temperature Tsmin -55 °C
Tsmax 150 °C
Solder & Assembly Solder & Assembly 260°/10s
Gate source leakage current IGSS 0.1 µA
@ VGS 16 V
Drain source leakage current IDSS 1 µA
@ VDS 32 V
Gate source voltage DC VGSS 20 V
Gate source voltage ESD VGSS null V
Forward transconductance gfs 29 mA/V
Intrinsic gate resistance RGi 2

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